Objeto
Suecia - Microscopios # Atomic Force Microscope (AFM) LOT-0002: Tenderer's suitability / Atomic Force Microscope (AFM) for the characterization of film samples and surfaces under both dry conditions and in liquid environments.
Entidad
Chalmers tekniska högskola Aktiebolag
Clasificadores
Aparatos de control y prueba
Microscopios